New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance

K. v. Klitzing; G. Dorda; M. Pepper

Năm xuất bản1980

Nguồn học thuậtPhysical Review Letters

Định danhDOI 10.1103/physrevlett.45.494

TRÍCH DẪN ĐỀ XUẤT

K. v. Klitzing; G. Dorda; M. Pepper (1980). New Method for High-Accuracy Determination of the Fine-Structure Constant Based on Quantized Hall Resistance. Physical Review Letters, 45(6), 494-497. https://doi.org/10.1103/physrevlett.45.494

Thông tin thư mục

Nguồn/Tạp chí: Physical Review Letters
Tập: 45
Số: 6
Trang: 494-497
Nhà xuất bản: American Physical Society (APS)
DOI: 10.1103/physrevlett.45.494 ↗

Từ khóa

Hall effect; Materials science; Semiconductor; Silicon; Voltage; Constant (computer programming); Transistor; Metal; Condensed matter physics; Field-effect transistor; Optoelectronics; Oxide; Quantum Hall effect; Thermal Hall effect; Electron; Magnetic field; Physics; Computer science; Quantum mechanics