HỒ SƠ TÀI LIỆU · #8.646
Investigation on origins of residual stresses in Ni-NiO system by X-ray diffraction at high temperature
Năm xuất bản1993
Nguồn học thuậtLe Journal de Physique IV
Định danhDOI 10.1051/jp4:19939102
TRÍCH DẪN ĐỀ XUẤTAPA 7
Chun Liu; Anne-Marie Huntz; Jean-Lou Lebrun (1993). Investigation on origins of residual stresses in Ni-NiO system by X-ray diffraction at high temperature. Le Journal de Physique IV, 03(C9), C9-987-C9-997. https://doi.org/10.1051/jp4:19939102
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